Roughness measurement of leaf surface based on shape from focus

Abstract Background Surface roughness has a significant effect on leaf wettability. Consequently, it influences the efficiency and effectiveness of pesticide application. Therefore, measurement surface offers support to relevant research efforts. To characterize roughness, prevailing methods have drawn from large equipment that often come with high costs poor portability, which is not suitable for field measurement. Additionally, such may even suffer inherent drawbacks like absence relationship between pixel intensity corresponding height scanning electron microscope (SEM). Results An imaging system variable object distance was created capture images plant leaves, method based shape focus (SFF) proposed. The given space-variantly blurred were processed proposed algorithm obtain leaves. improves current SFF through image alignment, distortion correction, introduction NaN values allows be applied precise 3d-reconstruction small-scale Conclusion Compared rely optical three-dimensional interference microscope, in this paper preserves overall topography surface, achieves superior cost performance at same time. It clear experiments standard gauge blocks RMSE step approximately 4.44 µm. Furthermore, according Friedman/Nemenyi test, measure operator SML expected demonstrate best performance.